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第七屆精密工程測(cè)量與儀器國際學(xué)術(shù)研討會(huì)(ISPEMI2011)

第七屆精密工程測(cè)量與儀器國際學(xué)術(shù)研討會(huì)(ISPEMI2011)

英文名稱:7thInternationalSymposiumonPrecisionEngineeringMeasurementandInstrumentation
會(huì)議時(shí)間:2011/8/7~2011/8/11
會(huì)議地點(diǎn):麗江
會(huì)議行業(yè):交通運(yùn)輸
第七屆精密工程測(cè)量與儀器國際學(xué)術(shù)研討會(huì)(ISPEMI2011)會(huì)議背景:
InternationalSymposiumonPrecisionEngineeringMeasurementsandInstrumentation(ISPEMI)isaninternationalsymposiumheldeveryyearindifferentcitiesofChinawithEnglishasitsofficiallanguagesince1999.
PriortoISPEMI2010,thereweretwointernationalsymposiaheldseparately,onewasInternationalSymposiumonPrecisionMechanicalMeasurement(ISPMM),andtheotherwasInternationalSymposiumonInstrumentationScienceandTechnology(ISIST).Inordertomakethesubjectareasofthesetwointernationalsymposiamoreprecise,specificandinterdisciplinary,thetwoorganizingcommitteesdecidedtomergethemintoone,andreferitasInternationalSymposiumonPrecisionEngineeringMeasurementsandInstrumentation(ISPEMI)fromISPEMI2010onward.Theconferencehasbeenheldbefore:
a)ISPEMI2010inHangzhou,China
b)ISPMM2002inHefei,ISPMM2004inBeijing,
ISPMM2006inXinjiangandISPMM2008inHefei
c)ISIST1999inLuoyang,ISIST2002inJinan,ISIST2004inXi'an,ISIST2006inHarbinandISIST2008inShenyang


第七屆精密工程測(cè)量與儀器國際學(xué)術(shù)研討會(huì)(ISPEMI2011)征文要求:
The7thISPEMI2011aimsatprovidinganopportunityforbothyoungandseniorprofessionalsworkinginthefieldofprecisionengineeringmeasurementsandinstrumentationbothinsideandoutsideChinatopresentandsharetheirworkandservethepurposesofpromotingacademicexchangesbetweenChineseandoverseasresearchworkers,advancingcooperationprogramsbetweenChineseandforeignuniversitiesandresearchinstitutes,andhelpingitsattendeesdeveloptheirknowledgeofthemostrecentadvancesinthisparticularfield.ThetopicsofISPEMI2011includebutnotlimitedto
Measurementtheoryandmethodology
PrecisionTheory&UncertaintyEvaluation
OptoelectronicSystemandOpticalInstrumentsDesign
ModernOpticsandInstrumentsforPrecisionMeasurement
Micro/NanoCoordinateMeasurementandInstrumentation
OpticalSuperResolutionMeasurementforNano/microDevices
MachineVisionandImageProcessing
SurfaceMeasurementandCharacterization
DeformationandStrainMeasurement
NDTandinstrumentation
Pre-,In-andPost-ProcessMeasurement
MeasurementSignalAnalysis&Processing
QualityEngineeringTheory&Technology

第七屆精密工程測(cè)量與儀器國際學(xué)術(shù)研討會(huì)(ISPEMI2011)聯(lián)系方式:
聯(lián)系人:組委會(huì) 先生
郵編:230009
地址:SchoolofInstrumentScienceandOpto-electronicEngineering,HefeiUniversityofTechnology,Hefei,Anhui230009,P.R.China
Email:ispemi@hfut.edu.cn

原文地址:
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